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Fundamentals Of Dimensional Metrology

Author: Connie L Dotson
Publisher: Cengage Learning
ISBN: 1305177746
Size: 79.45 MB
Format: PDF, ePub, Mobi
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Reflecting the latest changes in standards and technology, market-leading FUNDAMENTALS OF DIMENSIONAL METROLOGY, 6e combines hands-on applications with authoritative, comprehensive coverage of the principles, techniques, and devices used within today's dimensional metrology field. The Sixth Edition has been thoroughly revised and updated in direct response to reviewer feedback. The new edition features an easier to understand presentation, a new lab manual/workbook, updated photos and illustrations and updated references to measurement standards.. The text continues to use both metric and imperial systems but emphasizes metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Important Notice: Media content referenced within the product description or the product text may not be available in the ebook version.

Fundamentals Of Dimensional Metrology

Author: Connie Dotson
Publisher: United Nations Publications
ISBN: 9780766820715
Size: 71.69 MB
Format: PDF, ePub
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In modern industrial environments where responsibility for quality control is being placed upon individual workers, the understanding of dimensional metrology principles is becoming increasingly important. That's why the fourth edition of our best-selling Fundamentals of Dimensional Metrology book offers a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field today. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Information on particular devices and concepts, previously presented in separate chapters, has been combined to improve the logical flow of the material. New chapter-end review questions have also been added to eliminate the potential for ambiguity, allowing readers to gauge their understanding as they progress through the book.

Applied Metrology For Manufacturing Engineering

Author: Ammar Grous
Publisher: John Wiley & Sons
ISBN: 1118622596
Size: 62.71 MB
Format: PDF, Docs
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Applied Metrology for Manufacturing Engineering, stands out from traditional works due to its educational aspect. Illustrated by tutorials and laboratory models, it is accessible to users of non-specialists in the fields of design and manufacturing. Chapters can be viewed independently of each other. This book focuses on technical geometric and dimensional tolerances as well as mechanical testing and quality control. It also provides references and solved examples to help professionals and teachers to adapt their models to specific cases. It reflects recent developments in ISO and GPS standards and focuses on training that goes hand in hand with the progress of practical work and workshops dealing with measurement and dimensioning.

Handbook Of Dimensional Measurement

Author: Francis T. Farago
Publisher: Industrial Press Inc.
ISBN: 9780831130534
Size: 24.70 MB
Format: PDF
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A comprehensive guide to dimensional measurement technology, for engineers and technicians engaged in the various stages of industrial production. This edition has been extensively revised to include the computer and electronics revolution in metrology. Some two hundred changes and additions, inclu

Fundamental Principles Of Engineering Nanometrology

Author: Richard Leach
Publisher: Elsevier
ISBN: 1455777501
Size: 33.64 MB
Format: PDF
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Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty Fully updated to cover the latest technological developments, standards, and regulations

Handbook Of Optical Metrology

Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Size: 28.95 MB
Format: PDF
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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.