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Fundamentals Of Modern Vlsi Devices

Author: Yuan Taur
Publisher: Cambridge University Press
ISBN: 110739399X
Size: 29.35 MB
Format: PDF
View: 7677
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Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.

Fundamentals Of Modern Vlsi Devices

Author: Yuan Taur
Publisher: Cambridge University Press
ISBN: 9781107635715
Size: 78.48 MB
Format: PDF, ePub
View: 1317
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Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.

Fundamentals Of Modern Vlsi Devices

Author: Yuan Taur
Publisher: Cambridge University Press
ISBN: 9780521832946
Size: 80.66 MB
Format: PDF
View: 1080
Download and Read
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.

Modern Vlsi Design

Author: Wayne Wolf
Publisher: Prentice-Hall PTR
ISBN: 9780137145003
Size: 10.16 MB
Format: PDF, ePub, Mobi
View: 4466
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The award-winning VLSI design guide is now fully updated to reflect the latest advances in chip design

Fundamentals Of Ultra Thin Body Mosfets And Finfets

Author: Jerry G. Fossum
Publisher: Cambridge University Press
ISBN: 1107434491
Size: 56.14 MB
Format: PDF, ePub
View: 6327
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Understand the theory, design and applications of the two principal candidates for the next mainstream semiconductor-industry device with this concise and clear guide to FD/UTB transistors. • Describes FD/SOI MOSFETs and 3-D FinFETs in detail • Covers short-channel effects, quantum-mechanical effects, applications of UTB devices to floating-body DRAM and conventional SRAM • Provides design criteria for nanoscale FinFET and nanoscale thin- and thick-BOX planar FD/SOI MOSFET to help reduce technology development time • Projects potential nanoscale UTB CMOS performances • Contains end-of-chapter exercises. For professional engineers in the CMOS IC field who need to know about optimal non-classical device design and integration, this is a must-have resource.

Semiconductor Material And Device Characterization

Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Size: 16.54 MB
Format: PDF, ePub
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Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.

Classical And Object Oriented Software Engineering With Uml And C

Author: Stephen R. Schach
Publisher: McGraw-Hill Companies
ISBN:
Size: 64.70 MB
Format: PDF, ePub
View: 1964
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For professionals involved in large software development projects with thousands or even millions of lines of code, this best-selling guide offers complete coverage of both classic Software Lifecycle -- requirements, specifications, design, implementation, testing, and maintenance -- and the latest Object-Oriented design approaches. Important new issues, such as object patterns and software architecture, are also included.

Fundamentals Of Solid State Electronics

Author: Chih-Tang Sah
Publisher: World Scientific Publishing Company
ISBN: 9813103043
Size: 11.57 MB
Format: PDF, Mobi
View: 6307
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This Solution Manual, a companion volume of the book, Fundamentals of Solid-State Electronics, provides the solutions to selected problems listed in the book. Most of the solutions are for the selected problems that had been assigned to the engineering undergraduate students who were taking an introductory device core course using this book. This Solution Manual also contains an extensive appendix which illustrates the application of the fundamentals to solutions of state-of-the-art transistor reliability problems which have been taught to advanced undergraduate and graduate students. This book is also available as a set with Fundamentals of Solid-State Electronics and Fundamentals of Solid-State Electronics — Study Guide.