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Integrated Circuit Test Engineering

Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Size: 12.54 MB
Format: PDF, ePub
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Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

An Introduction To Mixed Signal Ic Test And Measurement

Author: Gordon W. Roberts
Publisher: Oxford University Press, USA
ISBN: 9780199796212
Size: 69.61 MB
Format: PDF, ePub
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With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems.

Digital Circuit Testing

Author: Francis C. Wong
Publisher: Elsevier
ISBN: 0080504345
Size: 50.14 MB
Format: PDF
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Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits

Author: Yichuang Sun
Publisher: IET
ISBN: 0863417450
Size: 32.95 MB
Format: PDF, ePub
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This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective.

Fault Diagnosis Of Analog Integrated Circuits

Author: Prithviraj Kabisatpathy
Publisher: Springer Science & Business Media
ISBN: 0387257438
Size: 56.49 MB
Format: PDF, Kindle
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Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Three Dimensional Integrated Circuit Design

Author: Vasilis F. Pavlidis
Publisher: Newnes
ISBN: 0124104843
Size: 62.99 MB
Format: PDF, ePub, Docs
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Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in circuit models, temperature considerations, power management, memory issues, and heterogeneous integration. 3-D IC experts Pavlidis, Savidis, and Friedman cover the full product development cycle throughout the book, emphasizing not only physical design, but also algorithms and system-level considerations to increase speed while conserving energy. A handy, comprehensive reference or a practical design guide, this book provides effective solutions to specific challenging problems concerning the design of three-dimensional integrated circuits. Expanded with new chapters and updates throughout based on the latest research in 3-D integration: Manufacturing techniques for 3-D ICs with TSVs Electrical modeling and closed-form expressions of through silicon vias Substrate noise coupling in heterogeneous 3-D ICs Design of 3-D ICs with inductive links Synchronization in 3-D ICs Variation effects on 3-D ICs Correlation of WID variations for intra-tier buffers and wires Offers practical guidance on designing 3-D heterogeneous systems Provides power delivery of 3-D ICs Demonstrates the use of 3-D ICs within heterogeneous systems that include a variety of materials, devices, processors, GPU-CPU integration, and more Provides experimental case studies in power delivery, synchronization, and thermal characterization

Principles Of Semiconductor Network Testing

Author: Amir Afshar
Publisher: Elsevier
ISBN: 9780080539560
Size: 65.19 MB
Format: PDF, Mobi
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Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers Best new source of information for experienced semiconductor engineers as well as entry-level personnel Eight chapters about semiconductor testing

Thermal Testing Of Integrated Circuits

Author: Josep Altet
Publisher: Springer Science & Business Media
ISBN: 1475736355
Size: 76.78 MB
Format: PDF, Mobi
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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.