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Introduction To Texture Analysis

Author: Olaf Engler
Publisher: CRC Press
ISBN: 9781420063660
Size: 72.25 MB
Format: PDF, Kindle
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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

Introduction To Texture Analysis

Author: Valerie Randle
Publisher: CRC Press
ISBN: 1482287471
Size: 10.70 MB
Format: PDF, Mobi
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Encompassing the concepts, practice, and application of orientation analysis, Introduction to Texture Analysis is an essential reference source for reserachers in textiles. The author uses an accessible style to share her expertise, providing comprehensive coverage of the theory and practice of the texture techniques now available and discusses their applications in research and industry. The text considers the merits of each technique for specific applications. Case studies expand upon the author's explanations and help illustrate the main principles involved. Topics include applications of diffraction, SEM- and TEM-based techniques, and crystallographic analyses.

Introduction To Texture Analysis

Author: Olaf Engler
Publisher: CRC Press
ISBN: 9781138410220
Size: 76.43 MB
Format: PDF
View: 6485
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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to

Introduction To Texture Analysis

Author: Olaf Engler
Publisher: CRC Press
ISBN: 9781420063653
Size: 27.19 MB
Format: PDF, Docs
View: 3115
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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

Texture Analysis In Materials Science

Author: H.-J. Bunge
Publisher: Elsevier
ISBN: 1483278395
Size: 59.59 MB
Format: PDF, Kindle
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Texture Analysis in Materials Science Mathematical Methods focuses on the methodologies, processes, techniques, and mathematical aids in the orientation distribution of crystallites. The manuscript first offers information on the orientation of individual crystallites and orientation distributions. Topics include properties and representations of rotations, orientation distance, and ambiguity of rotation as a consequence of crystal and specimen symmetry. The book also takes a look at expansion of orientation distribution functions in series of generalized spherical harmonics, fiber textures, and methods not based on the series expansion. The publication reviews special distribution functions, texture transformation, and system of programs for the texture analysis of sheets of cubic materials. The text also ponders on the estimation of errors, texture analysis, and physical properties of polycrystalline materials. Topics include comparison of experimental and recalculated pole figures; indetermination error for incomplete pole figures; and determination of the texture coefficients from anisotropie polycrystal properties. The manuscript is a dependable reference for readers interested in the use of mathematical aids in the orientation distribution of crystallites.

Electron Microscopy And Analysis Third Edition

Author: Peter J. Goodhew
Publisher: CRC Press
ISBN: 9780748409686
Size: 70.11 MB
Format: PDF, Docs
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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Texture And Anisotropy

Author: U. F. Kocks
Publisher: Cambridge University Press
ISBN: 9780521794206
Size: 42.48 MB
Format: PDF, Mobi
View: 2003
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A successful book covering an important area of materials science, now available in paperback.

Image Processing

Author: Maria Petrou
Publisher: John Wiley & Sons
ISBN: 047074586X
Size: 62.45 MB
Format: PDF, ePub, Docs
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Following the success of the first edition, this thoroughly updated second edition of Image Processing: The Fundamentals will ensure that it remains the ideal text for anyone seeking an introduction to the essential concepts of image processing. New material includes image processing and colour, sine and cosine transforms, Independent Component Analysis (ICA), phase congruency and the monogenic signal and several other new topics. These updates are combined with coverage of classic topics in image processing, such as orthogonal transforms and image enhancement, making this a truly comprehensive text on the subject. Key features: Presents material at two levels of difficulty: the main text addresses the fundamental concepts and presents a broad view of image processing, whilst more advanced material is interleaved in boxes throughout the text, providing further reference for those who wish to examine each technique in depth. Contains a large number of fully worked out examples. Focuses on an understanding of how image processing methods work in practice. Illustrates complex algorithms on a step-by-step basis, and lists not only the good practices but also identifies the pitfalls in each case. Uses a clear question and answer structure. Includes a CD containing the MATLAB® code of the various examples and algorithms presented in the book. There is also an accompanying website with slides available for download for instructors as a teaching resource. Image Processing: The Fundamentals, Second Edition is an ideal teaching resource for both undergraduate and postgraduate students. It will also be of value to researchers of various disciplines from medicine to mathematics with a professional interest in image processing

Electron Backscatter Diffraction In Materials Science

Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Size: 70.76 MB
Format: PDF, Mobi
View: 1997
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Orientations And Rotations

Author: Adam Morawiec
Publisher: Springer Science & Business Media
ISBN: 3662091569
Size: 40.68 MB
Format: PDF
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Essentially, Orientations and Rotations treats the mathematical and computational foundations of texture analysis. It contains an extensive and thorough introduction to parameterizations and geometry of the rotation space. Since the notions of orientations and rotations are of primary importance for science and engineering, the book can be useful for a very broad audience using rotations in other fields.