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Mechanical Testing Of Advanced Fibre Composites

Author: J M Hodgkinson
Publisher: Elsevier
ISBN: 1855738910
Size: 23.45 MB
Format: PDF, Docs
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Testing of composite materials can present complex problems but is essential in order to ensure the reliable, safe and cost-effective performance of any engineering structure. This essentially practical book, complied from the contributions of leading professionals in the field, describes a wide range of test methods which can be applied to various types of advanced fibre composites. The book focuses on high modulus, high strength fibre/plastic composites and also covers highly anisotrpoic materials such as carbon, aramid and glass. Engineers and designers specifying the use of materials in structures will find this book an invaluable guide to best practice throughout the range of industrial sectors where FRCs are employed.

Structural Materials

Author: Donald McLean
Publisher: Woodhead Pub Ltd
ISBN: 9780901716828
Size: 80.12 MB
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An international meeting held to honour, on his 80th birthday, the lifetime contributions to physical metallurgy of Donald McLean. Distinguished authors from China, Australia, the United States and Japan as well as the EU, have contributed 19 papers concentrating on grain boundaries and creep deformation and fracture.

Springer Handbook Of Metrology And Testing

Author: Horst Czichos
Publisher: Springer Science & Business Media
ISBN: 9783642166419
Size: 21.28 MB
Format: PDF, ePub
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This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.

Quality Systems And Standards For A Competitive Edge

Author:
Publisher: World Bank Publications
ISBN: 0821368958
Size: 57.14 MB
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This book responds to the challenge of providing a comprehensive account of quality systems for private sector development: what works and what doesnt on the ground, and why. This volume provides a thorough analysis of the diversity of institutions, linkages, and arrangements involved in quality systems, identifying success factors in countries quality strategies. It explains why quality and standards matter for export growth, for productivity, for industrial upgrading, and for diffusion of innovation, all central ingredients in improving economic growth and generating real gains in poverty reduction. It provides a detailed blue print for implementing effective National Quality Systems. Quality and Standards Matter is a valuable tool for policymakers confronted with the challenges of building trade competitiveness in the new global economy.

Metrology And Diagnostic Techniques For Nanoelectronics

Author: Zhiyong Ma
Publisher: CRC Press
ISBN: 1351733958
Size: 68.35 MB
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Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Handbook Of Silicon Semiconductor Metrology

Author: Alain C. Diebold
Publisher: CRC Press
ISBN: 0203904540
Size: 59.55 MB
Format: PDF, Kindle
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Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay, acoustic film thickness, dopant dose, junction depth, and electrical measurements; particle and defect detection; and flatness following chemical mechanical polishing. Providing examples of well-developed metrology capability, the book focuses on metrology for lithography, transistor, capacitor, and on-chip interconnect process technologies.