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Nanocrystalline Ceramics

Author: Markus Winterer
Publisher: Springer Science & Business Media
ISBN: 3662049767
Size: 34.51 MB
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Nanocrystalline materials are three-dimensional ultrafine, polycrystalline microstructures. They give rise to interesting and useful chemical and physical-size effects. This book describes the development of a method of synthesizing chemical vapor for the production of nanocrystalline ceramic powders. The development of the microstructure during sintering is studied and the influence of the synthesis parameters on the structure and properties of the nanocrystalline ceramics from the atomic to the microstructural level is investigated. The emerging unified view, from powder synthesis and ceramic processing to structural characterization and determination of properties, provides a detailed understanding of the materials and enables better quality control of the end products.

Nanomaterials By Severe Plastic Deformation

Author: Michael J. Zehetbauer
Publisher: John Wiley & Sons
ISBN: 3527604944
Size: 80.67 MB
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These proceedings of the "Second International Conference on Nanomaterials by Severe Plastic Deformation" review the enormous scientific avalanche that has been developing in the field over recent years. A valuable resource for any scientist and engineer working in this emerging field of nanotechnology.

Into The Nano Era

Author: Howard Huff
Publisher: Springer Science & Business Media
ISBN: 3540745599
Size: 49.26 MB
Format: PDF, Mobi
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Even as we tentatively enter the nanotechnology era, we are now encountering the 50th anniversary of the invention of the IC. Will silicon continue to be the pre-eminent material and will Moore’s Law continue unabated, albeit in a broader economic venue, in the nanotechnology era? This monograph addresses these issues by a re-examination of the scientific and technological foundations of the micro-electronics era. It also features two visionary articles of Nobel laureates.

Electronic Structure And Magnetism Of Complex Materials

Author: David J. Singh
Publisher: Springer Science & Business Media
ISBN: 3662053101
Size: 79.90 MB
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Recent developments in electronic structure theory have led to a new understanding of magnetic materials at the microscopic level. This enables a truly first-principles approach to investigations of technologically important magnetic materials. Among the advances treated here have been practical schemes for handling non-collinear magnetic systems, including relativity, and an understanding of the origins and role of orbital magnetism within band structure formalisms. This book provides deep theoretical insight into magnetism, mahneatic materials, and magnetic systems. It covers these recent developments with review articles by some of the main originators of these developments.

Ferroelectric Crystals For Photonic Applications

Author: Pietro Ferraro
Publisher: Springer Science & Business Media
ISBN: 3540779655
Size: 42.39 MB
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This book deals with the latest achievements in the field of ferroelectric domain engineering and characterization at micron- and nano-scale dimensions and periods. The book collects the results obtained in recent years by world renowned scientific leaders in the field, thus providing a valid and unique overview of the state-of-the-art. At the same time the book provides a view to future applications of those engineered materials in the field of photonics.

Extended Defects In Germanium

Author: Cor Claeys
Publisher: Springer Science & Business Media
ISBN: 3540856145
Size: 56.99 MB
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The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and {311} defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical properties, which are important for devices made in dislocated Ge. The second part treats the creation of extended defects during wafer and device processing. Issues are addressed such as defect formation during ion implantation, necessary to create junctions, which are an essential part in every device type. Extended defects are also created during the deposition of thin or thick epitaxial layers on other substrates, which are important for optoelectronic and photovoltaic applications. In brief, the book is intended to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control.

Morphology Control Of Materials And Nanoparticles

Author: Yoshio Waseda
Publisher: Springer Science & Business Media
ISBN: 3662088630
Size: 51.23 MB
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This is the first major compilation of new advances covering the current status and topics related to the processing and production of precisely controlled materials. It provides a unique source of information and guidance for specialists and non-specialists alike. This book represents an extended introductory treatise on the fundamental aspects, new methods for the precise control of morphology (size, shape, composition, structure etc.) and accurate materials characterization, from both the basic science and the applied engineering viewpoints.

Dielectric Properties Of Porous Media

Author: S.O. Gladkov
Publisher: Springer Science & Business Media
ISBN: 3662067056
Size: 52.45 MB
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This monograph systematically presents the fundamentals of theoretical and experimental research into the most important physical characteristics of porous structures. Non-standard behavior of certain physical parameters, such as the breakdown of the electric field of porous substances, is described. The method of calculation of the thermal conductivity coefficient of porous dielectrics, based on the non-equilibrium principle, is illustrated in detail. This approach is then applied to the investigation of the properties of "disparate" substances such as cellulose matrices, composites, and fibrous structures. The book is intended for physicists, physical chemists and materials scientists at research and postgraduate levels; it may also be helpful to engineers and technical workers in the applied sciences.

High Resolution Imaging And Spectrometry Of Materials

Author: Frank Ernst
Publisher: Springer Science & Business Media
ISBN: 3662077663
Size: 69.86 MB
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The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.

Radiation Effects In Advanced Semiconductor Materials And Devices

Author: C. Claeys
Publisher: Springer Science & Business Media
ISBN: 3662049740
Size: 31.15 MB
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This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.