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Optical Characterization Of Semiconductors

Author: Sidney Perkowitz
Publisher: Elsevier
ISBN: 0080984274
Size: 25.49 MB
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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories

Optical Techniques For Solid State Materials Characterization

Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 9781439815373
Size: 36.38 MB
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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video

Planar Graphs

Author: Takao Nishizeki
Publisher: Courier Corporation
ISBN: 048646671X
Size: 40.88 MB
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This text features most of the important theorems and algorithms for planar graphs. Suitable as a textbook, it is also useful for researchers and includes an extensive reference section. 1988 edition.

Optical Properties Of Solids

Author: Mark Fox
Publisher: Oxford University Press
ISBN: 0199573360
Size: 41.92 MB
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The second edition of this successful textbook provides an up-to-date account of the optical physics of solids. All of the chapters have been updated and improved, and new sections on optical control of spin, quantum dots, plasmonics, negative refraction, carbon nanostructures and diamond NV centres have been added.

Handbook Of Self Assembled Semiconductor Nanostructures For Novel Devices In Photonics And Electronics

Author: Mohamed Henini
Publisher: Elsevier
ISBN: 9780080560472
Size: 56.84 MB
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The self-assembled nanostructured materials described in this book offer a number of advantages over conventional material technologies in a wide range of sectors. World leaders in the field of self-organisation of nanostructures review the current status of research and development in the field, and give an account of the formation, properties, and self-organisation of semiconductor nanostructures. Chapters on structural, electronic and optical properties, and devices based on self-organised nanostructures are also included. Future research work on self-assembled nanostructures will connect diverse areas of material science, physics, chemistry, electronics and optoelectronics. This book will provide an excellent starting point for workers entering the field and a useful reference to the nanostructured materials research community. It will be useful to any scientist who is involved in nanotechnology and those wishing to gain a view of what is possible with modern fabrication technology. Mohamed Henini is a Professor of Applied Physics at the University of Nottingham. He has authored and co-authored over 750 papers in international journals and conference proceedings and is the founder of two international conferences. He is the Editor-in-Chief of Microelectronics Journal and has edited three previous Elsevier books. Contributors are world leaders in the field Brings together all the factors which are essential in self-organisation of quantum nanostructures Reviews the current status of research and development in self-organised nanostructured materials Provides a ready source of information on a wide range of topics Useful to any scientist who is involved in nanotechnology Excellent starting point for workers entering the field Serves as an excellent reference manual

Semiconductor Material And Device Characterization

Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Size: 21.87 MB
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Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.

Fundamentals Of Semiconductors

Author: Peter YU
Publisher: Springer Science & Business Media
ISBN: 9783642007101
Size: 15.61 MB
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Excellent bridge between general solid-state physics textbook and research articles packed with providing detailed explanations of the electronic, vibrational, transport, and optical properties of semiconductors "The most striking feature of the book is its modern outlook ... provides a wonderful foundation. The most wonderful feature is its efficient style of exposition ... an excellent book." Physics Today "Presents the theoretical derivations carefully and in detail and gives thorough discussions of the experimental results it presents. This makes it an excellent textbook both for learners and for more experienced researchers wishing to check facts. I have enjoyed reading it and strongly recommend it as a text for anyone working with semiconductors ... I know of no better text ... I am sure most semiconductor physicists will find this book useful and I recommend it to them." Contemporary Physics Offers much new material: an extensive appendix about the important and by now well-established, deep center known as the DX center, additional problems and the solutions to over fifty of the problems at the end of the various chapters.

Practical Materials Characterization

Author: Mauro Sardela
Publisher: Springer
ISBN: 1461492815
Size: 22.11 MB
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Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Optical Constants Of Crystalline And Amorphous Semiconductors

Author: Sadao Adachi
Publisher: Springer Science & Business Media
ISBN: 1461552478
Size: 58.15 MB
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Knowledge of the refractive indices and absorption coefficients of semiconductors is especially import in the design and analysis of optical and optoelectronic devices. The determination of the optical constants of semiconductors at energies beyond the fundamental absorption edge is also known to be a powerful way of studying the electronic energy-band structures of the semiconductors. The purpose of this book is to give tabulated values and graphical information on the optical constants of the most popular semiconductors over the entire spectral range. This book presents data on the optical constants of crystalline and amorphous semiconductors. A complete set of the optical constants are presented in this book. They are: the complex dielectric constant (E=e.+ieJ, complex refractive index (n*=n+ik), absorption coefficient (a.), and normal-incidence reflectivity (R). The semiconductor materials considered in this book are the group-IV elemental and binary, llI-V, IT-VI, IV-VI binary semiconductors, and their alloys. The reader will fmd the companion book "Optical Properties of Crystalline and Amorphous Semiconductors: Materials and Fundamental Principles" useful since it emphasizes the basic material properties and fundamental prinCiples.

Raman Spectroscopy For Nanomaterials Characterization

Author: Challa S.S.R. Kumar
Publisher: Springer Science & Business Media
ISBN: 3642206204
Size: 33.88 MB
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First volume of a 40-volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Raman spectroscopy for the characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume essential reading for research scientists in academia and industry.