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Optical Microscopy Of Materials

Author: Raymond Haynes
Publisher: Springer Science & Business Media
ISBN: 147576085X
Size: 73.23 MB
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Since Sorby published his observations on the structures of steels in 1863, the optical microscope has become one of the most widely used and versatile instruments for examining the structures of engineering materials. Moreover, to examine the diverse range of materials encountered, it must be used in both the reflected-light and transmitted-light forms, and with polarized light. It is complementary to, but not superseded by, the wide range of electron-optical instruments that are now used. Despite its extensive use, it has been described as the most misused, abused, and misunderstood of scientific instruments, for it will produce an image of a sort no matter how badly it is used. To use it effectively, even in its simplest applications, a knowledge of the simple theory of the microscope is necessary, for the theory shows and explains how it should be used. Thus my aim has been to give a simple and, where possible, quantitative account of both the theory and the use of the microscope, including the various special techniques for which it can be used. But, no matter how effectively the microscope is used, if the specimen is inadequately prepared the results of examination will be of doubtful value.

Microscopy Techniques For Materials Science

Author: Ashley Reginald Clarke
Publisher: Woodhead Publishing
ISBN: 9781855735873
Size: 20.41 MB
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Annotation CONTENTS Part 1 Basic principles: Interaction of EM radiation with materials; Digital imaging and processing. Part 2 2D Optical reflection and confocal laser scanning microscopy: 2D Optical reflection microscopy; 3D Confocal Laser Scanning. Part 3 Other microscopical techniques: Complementary optical and EM imaging techniques; Other microscopy techniques.

Optical Microscopy Of Fiber Reinforced Composites

Author: Brian S. Hayes
Publisher: ASM International
ISBN: 161503143X
Size: 28.35 MB
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Optical microscopy is one of the most valuable--but under utilized--tools for analyzing fiber reinforced polymer matrix composites. This hands-on instructional book covers everything: sample preparation, microscopic techniques, and applications. The power of optical microscopy to study the microstructure of these heterogeneous, anisotropic materials is illustrated with over 180 full color images.

Microstructural Characterization Of Materials

Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Size: 61.68 MB
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Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

Metallurgical Microscopy

Author: Helfrid Modin
Publisher: Elsevier
ISBN: 148314478X
Size: 77.95 MB
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Metallurgical Microscopy provides the general principles, methods, and techniques in metallurgical microscopy. The book initially provides the techniques for specimen preparation for macroscopic and microscopic examination. Subsequent chapters are devoted to the discussion of light-optical microscopy and photography, interferometry and contrast-raising methods, and microhardness measurement. Topics on high-temperature microscopy, a brief review of the electron microprobe and its applications, and the construction, properties and applications of the electron microscope are presented as well. Metallurgists and materials scientists will find the book very informative and useful.

Electron Microscopy In Material Science

Author: U Valdre
Publisher: Elsevier
ISBN: 0323142567
Size: 32.96 MB
Format: PDF
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Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.

Characterization Of Materials

Author: John Wiley & Sons Inc
Publisher: John Wiley & Sons
ISBN: 9780471266969
Size: 69.85 MB
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"A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"--

Materials Characterization

Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 3527670793
Size: 27.22 MB
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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

Optical Techniques For Solid State Materials Characterization

Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 1439814376
Size: 17.12 MB
Format: PDF, ePub
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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video