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Scanning Microscopy For Nanotechnology

Author: Weilie Zhou
Publisher: Springer Science & Business Media
ISBN: 0387396209
Size: 49.62 MB
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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Author:
Publisher: 清华大学出版社有限公司
ISBN: 9787302111887
Size: 27.87 MB
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本书是一本关于各种显微学的原理及其在该迅猛发展的领域内应用的综述参考书。本书涵盖的范围包括共聚焦光学显微镜、扫描近场光学显微镜、各种扫描探针显微术、离子和电子显微镜、电子能量损失和X射线谱等。

Scanning Probe Microscopy In Nanoscience And Nanotechnology 2

Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 9783642104978
Size: 14.18 MB
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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy In Nanoscience And Nanotechnology 3

Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642254136
Size: 11.89 MB
Format: PDF, ePub, Mobi
View: 350
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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Nanocharacterisation

Author: Angus Kirkland
Publisher: Royal Society of Chemistry
ISBN: 0854042415
Size: 47.33 MB
Format: PDF
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Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.

Handbook Of Microscopy For Nanotechnology

Author: Nan Yao
Publisher: Springer Science & Business Media
ISBN: 1402080069
Size: 57.69 MB
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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Nanotechnology Research Methods For Food And Bioproducts

Author: Graciela Wild Padua, PhD
Publisher: John Wiley & Sons
ISBN: 1118229363
Size: 60.33 MB
Format: PDF
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Food nanotechnology is an expanding field. This expansion is based on the advent of new technologies for nanostructure characterization, visualization, and construction. Nanotechnology Research Methods for Food and Bioproducts introduces the reader to a selection of the most widely used techniques in food and bioproducts nanotechnology. This book focuses on state-of-the-art equipment and contains a description of the essential tool kit of a nanotechnologist. Targeted at researchers and product development teams, this book serves as a quick reference and a guide in the selection of nanotechnology experimental research tools.

Scanning Probe Microscopy For Energy Research

Author: Dawn A Bonnell
Publisher: World Scientific
ISBN: 9814434728
Size: 50.21 MB
Format: PDF, ePub
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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field. Contents:Introduction:Local Probes in the Next Decade of Energy Research: Bridging Macroscopic and Atomic Worlds (D A Bonnell and S V Kalinin)Scanning Probes for Energy Harvesting Systems: Photovoltaics and Solar Cells:Electrical Scanning Probe Microscopy on Solar Cell Materials (R Giridharagopal, G E Rayermann and D S Ginger)Organic Solar Cell Materials and Devices Characterized by Conductive and Photoconductive Atomic Force Microscopy (X-D Dang, M Guide and T-Q Nguyen)Kelvin Probe Force Microscopy for Solar Cell Applications (T Glatzel)Reversible Rectification in Sub-Monolayer Molecular P-N Junctions: Towards Nanoscale Photovoltaic Studies (J A Smerdon, N C Giebink and J R Guest)Study of Photoinduced Charges with Atomic Force Microscopy (M Dokukin, N Guz and I Sokolov)Imaging of Nanoscale Photogenerated Charge Transport in Organic Photovoltaic Materials (B Hamadani, P M Haney and N B Zhitenev)Photoassisted Kelvin Probe Force Microscopy for Characterization of Solar Cell Materials (T Takahashi)Scanning Probes for Fuel Cells and Local Electrochemistry:Electrochemical Strain Microscopy of Oxygen-Ion Conductors: Fuel Cells and Oxide Electronics (A Kumar, S Jesse, S V Kalinin, F Ciucci and A Morozovska)Ion Dynamics in Nanoscopic Subvolumes of Solid Electrolytes Analysed by Electrostatic Force Spectroscopy (A Schirmeisen and B Roling)Nanoscale Electrochemistry in Energy Related Systems Using Atomic Force Microscopy (W Lee, M H Lee, R P O'Hayre and F B Prinz)Scanning Probe Microscopy of Fuel Cell Materials Under Realistic Operating Conditions (S S Nonnenmann and D A Bonnell)Scanning Probe Microscopy of Energy Storage Materials and Devices:In situ SPM Analysis of Interfacial Phenomena in Lithium-Ion Batteries (M Inaba, S-K Jeong and Z Ogumi)Conducting-Probe Atomic Force Microscopy of Electrochemical Interfaces (P A Veneman and K J Stevenson)Electrochemical Strain Microscopy of Li-ion and Li-air Battery Materials (T M Arruda, N Balke, S Jesse and S V Kalinin)Emerging Scanning Probe Techniques:High Sensitivity Scanning Impedance Microscopy and Spectroscopy (S S Nonnenmann, X Chen and D A Bonnell)Scanning Microwave Microscopy: Advances in Quantitative Capacitance and Carrier Density Measurements at the Nanometer Scale (S Wu, F Kienberger and H Tanbakuchi)Mapping Electrochemistry at the Micro and Nanoscales with Scanning Ion Conductance Microscopy (C Laslau, D E Williams and J Travas-Sejdic)Force Microscopy, Nanochemistry and Nanofabrication (R Garcia, M Chiesa and Y K Ryu)Studying the Mechanism of Piezoelectric Nanogenerators (J Song and Z L Wang) Readership: Students, professionals and researchers in materials science, nanomaterials and new materials. Keywords:Energy Materials;Scanning Probe Microscopy;Fuel Cells;Photovoltaics;Batteries;Solar CellsKey Features:A first broad overview of SPM for energy materials and devicesWritten by world leaders in scanning probe microscopyContains both applications of established SPM techniques as well as overview of novel emergent methods and addresses applications in all major arenas of energy: alternative energy generation, energy harvesting, and storage

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 9781441972002
Size: 59.64 MB
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Quantitative Data Processing In Scanning Probe Microscopy

Author: Petr Klapetek
Publisher: Elsevier
ISBN: 0128133481
Size: 49.73 MB
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Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques