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Three Dimensional Surface Topography

Author: Ken J Stout
Publisher: Elsevier
ISBN: 9780080542980
Size: 44.75 MB
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This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

Development Of Methods For The Characterisation Of Roughness In Three Dimensions

Author: Ken Stout
Publisher: Kogan Page Publishers
ISBN: 9781857180237
Size: 77.46 MB
Format: PDF, ePub, Docs
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Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard. · Updated version of noted previous publication · Contains basis, for the first time, for a unified approach to the subject · The basis for a 3D international standard

Optical Measurement Of Surface Topography

Author: Richard Leach
Publisher: Springer Science & Business Media
ISBN: 9783642120121
Size: 38.83 MB
Format: PDF
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The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Process Machine Interactions

Author: Berend Denkena
Publisher: Springer Science & Business Media
ISBN: 3642324487
Size: 29.74 MB
Format: PDF, ePub
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This contributed volume collects the scientific results of the DFG Priority Program 1180 Prediction and Manipulation of the Interactions between Structures and Processes. The research program has been conducted during the years 2005 and 2011, whereas the primary goal was the analysis of the interactions between processes and structures in modern production facilities. This book presents the findings of the 20 interdisciplinary subprojects, focusing on different manufacturing processes such as high performance milling, tool grinding or metal forming. It contains experimental investigations as well as mathematical modeling of production processes and machine interactions. New experimental advancements and novel simulation approaches are also included.

Fib Nanostructures

Author: Zhiming M. Wang
Publisher: Springer Science & Business Media
ISBN: 331902874X
Size: 66.93 MB
Format: PDF
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FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electrical engineering, and materials science departments as a reference on materials science and device design.

International Progress In Precision Engineering

Author: Fumiko Ikawa-Smith
Publisher: Elsevier
ISBN: 0124158986
Size: 45.57 MB
Format: PDF, Mobi
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International Progress in Precision Engineering documents the proceedings of the 7th International Precision Engineering Seminar held in Kobe, Japan, May 1993. The seminar brought together the world's leading precision engineering practitioners from areas of application as diverse as sensors, actuators, scanning tip microscopy, micro and nano machining (including bio-machining), ultra precision measuring machines, machine tools, and large optics for space technology. The seminar included 10 oral sessions that dealt with the following topics: (I) Metrology - The Science Base For Precision Engineering; (II) Sensors and Actuators in Precision Engineering and Nanotechnology; (III) New Materials - Applications and Ultra-Precision Energy Beam Processing; (IV) Nanotechnology Machining Processes; (V) New Developments In Ultra-Precision Machines; (VI) Ultra-Precision, Servo, and Control Technology; (VII) Precision Engineering in Space Technology; (VIII) X-Ray Technologies and Their Applications; (IX) Micromechanics and Micrometrology; and (X) New Developments n Precision Engineering. There were also poster sessions and an introductory keynote speech by Dr. H. Mizuno, Executive Vice-President of Matsushita/Panasonic, who talks on the symbiotic relationship between electronics and precision engineering.

Basics Of Precision Engineering

Author: Richard Leach
Publisher: CRC Press
ISBN: 0429887442
Size: 33.34 MB
Format: PDF, ePub
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Advances in engineering precision have tracked with technological progress for hundreds of years. Over the last few decades, precision engineering has been the specific focus of research on an international scale. The outcome of this effort has been the establishment of a broad range of engineering principles and techniques that form the foundation of precision design. Today’s precision manufacturing machines and measuring instruments represent highly specialised processes that combine deterministic engineering with metrology. Spanning a broad range of technology applications, precision engineering principles frequently bring together scientific ideas drawn from mechanics, materials, optics, electronics, control, thermo-mechanics, dynamics, and software engineering. This book provides a collection of these principles in a single source. Each topic is presented at a level suitable for both undergraduate students and precision engineers in the field. Also included is a wealth of references and example problems to consolidate ideas, and help guide the interested reader to more advanced literature on specific implementations.