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Zzaap Training Esd Fri And Emi

Author: M. Bruce Corp
Publisher: Academic Press
ISBN: 008091750X
Size: 79.70 MB
Format: PDF, ePub
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A "zzap"! is the mortal enemy of today's sophisticated electronics designs. A "zzaap!" can cause a circuit to "lock up" or "hang" -delete bits form a data stream or mysteriously insert bits that aren't supposed to be there or, worst of all, cause the sudden failure of critical integrated circuits. M. Bruce Corp takes you inside the often mysterious world of electrostatic discharge (ESD), radio frequency interference (RFI, and electromagnetic interference (EMI) to show how these can cause a bewildering array of transient problems or catastrophic failures.

Ahandbook For Emc Testing And Measurement

Author: David Morgan
Publisher: IET
ISBN: 0863417566
Size: 66.87 MB
Format: PDF, ePub, Mobi
View: 7395
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This major reference book is aimed at engineers and technical managers concerned with EMC (electromagnetic compatibility). It explains why EMC testing is necessary, what standards must be met, how such testing is carried out (and therefore how to prepare for it), what accuracy and repeatability can be expected, and when to test.

Electromagnetic Compatibility Handbook

Author: Kenneth L. Kaiser
Publisher: CRC Press
ISBN: 9780849320873
Size: 28.69 MB
Format: PDF, Docs
View: 4662
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As the number of electrical devices in use continues to grow, so do the challenges of ensuring the electromagnetic compatibility (EMC) of products and systems. Fortunately, engineers have at their disposal an array of approximations, models, and rules-of-thumb to help them meet those challenges. Unfortunately, the number of these tools and guidelines is overwhelming, and worse still is the thought of investigating their origins and confirming their results. The Electromagnetic Compatibility Handbook is an unprecedented compilation of the many approximations, guidelines, models, and rules-of-thumb used in EMC analyses, complete with their sources and their limitations. The book presents these in an efficient question-and-answer format and incorporates an extremely comprehensive set of tables and figures. The author has either derived from basic principles or obtained and verified from their original sources all of the expressions in the tables. Mathcad was used to generate most of the plots and solve many of the equations, and the author includes the Mathcad programs for many of these so users can clearly see the variable assignments, assumptions, and equations. Designed to be of long-lasting value to engineers, researchers, and students, the Electromagnetic Compatibility Handbook is ideal both for quick reference and as a textbook for upper-level and graduate electrical engineering courses.

Transmission Lines Matching And Crosstalk

Author: Kenneth L. Kaiser
Publisher: CRC Press
ISBN: 9780849363627
Size: 59.59 MB
Format: PDF
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In chapters culled from the popular and critically acclaimed Electromagnetic Compatibility Handbook, Transmission Lines, Matching, and Crosstalk provides a tightly focused, convenient, and affordable reference for those interested primarily in this subset of topics. Author Kenneth L. Kaiser demystifies transmission lines, matching, and crosstalk and explains the source and limitations of the approximations, guidelines, models, and rules-of-thumb used in this field. The material is presented in a unique question-and-answer format that gets straight to the heart of each topic. The book includes numerous examples and uses Mathcad to generate all of the figures and many solutions to equations. In many cases, the entire Mathcad program is provided.

Electromagnetic Shielding

Author: Kenneth L. Kaiser
Publisher: CRC Press
ISBN: 9780849363726
Size: 67.30 MB
Format: PDF, Mobi
View: 6254
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In chapters culled from popular and critically acclaimed Electromagnetic Compatibility Handbook, Electromagnetic Shielding provides a tightly focused, convenient, and affordable reference for those interested primarily in this subset of topics. Author Kenneth L. Kaiser demystifies shielding and explains the source and limitations of the approximations, guidelines, models, and rules-of-thumb used in this field. The material is presented in a unique question-and-answer format that gets straight to the heart of each topic. The book includes numerous examples and uses Mathcad to generate all of the figures and many solutions to equations. In many cases, the entire Mathcad program is provided.

Basic Esd And I O Design

Author: Sanjay Dabral
Publisher: Wiley-Interscience
ISBN:
Size: 53.40 MB
Format: PDF, Docs
View: 886
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The first comprehensive guide to ESD protection and I/O design Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job. This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design: * Describes strategies for design-oriented ESD protection * Explains layout methods that enhance ESD protection designs * Addresses basic I/O designs, including new problems such as mixed voltage interfaces * Discusses fabrication aspects affecting ESD and I/O protection * Illustrates concepts using numerous figures and examples * Expresses device physics in terms of simple electrical circuit models * Cross-references the material to standard texts in the field Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture.