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Advances In Imaging And Electron Physics

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 9780080550558
Size: 56.23 MB
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances In Imaging And Electron Physics

Publisher: Academic Press
ISBN: 0124077285
Size: 79.14 MB
Format: PDF, Docs
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Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field

Spatially Resolved Characterization Of Local Phenomena In Materials And Nanostructures

Author: Javier Piqueras
Size: 31.84 MB
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A primary driver of progress in nanoscience and technology is the continuing advances in the ability to measure structure, and particularly properties, at spatially localized scales. From the point of view of characterization, it is worth mentioning advances in the interpretation of processes in semiconductors, the ability to observe and manipulate metal, carbon and silicon nanowires and nanodots, and studies in molecular self-assembly. The papers in this book fall into two categories - those addressing classes of characterization techniques that emphasize how the combination of theoretical, experimental, and instrumentational developments lead to new capabilities in nanoscale characterization, and those focused on the use of various spatially localized approaches on a single phenomenon or materials issue. Topics include: characterization with electron optics; novel measurements of nanoscale properties; size-dependent behavior of nanoparticles; biological systems at the nanoscale; processing and properties of nanowires and heterostructures; and local phenomena in materials and microstructures.

Ramas Risk Calc 4 0 Software

Author: Scott Ferson
Publisher: CRC Press
ISBN: 9781566705769
Size: 64.80 MB
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Many analysts use point estimates and ignore their uncertainty. But we can never be sure about the exact values of numbers based on data. And no practical calculations are without error, even though they may have the appearance of precision. RAMASâ Risk Calc 4.0 Software: Risk Assessment with Uncertain Numbers uses traditional methods such as probability theory and interval analysis and the newest techniques such as probability bounds analysis and fuzzy arithmetic to quantify uncertainty in risk assessments. It creates a convenient environment for computing in which all uncertainties are carried forward automatically. Providing examples in four major application areas, Risk Calc brings sophisticated methods of uncertainty analysis into the reach of anyone who can do arithmetic on a calculator.

Handbook Of Biological Confocal Microscopy

Author: James Pawley
Publisher: Springer Science & Business Media
ISBN: 1461571332
Size: 22.81 MB
Format: PDF
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In 1987 the Electron Microscopy Society of America (EMSA) going to drive important scientific discoveries across wide areas under the leadership of J. P. Revel (Cal Tech) initiated a major of physiology, cellular biology and neurobiology. They had been program to present a discussion of recent advances in light looking for a forum in which they could advance the state of microscopy as part of the annual meeting. The result was three the art of confocal microscopy, alert manufacturers to the lim special LM sessions at the Milwaukee meeting in August 1988: itations of current instruments, and catalyze progress toward The LM Forum, organized by me, and Symposia on Confocal new directions in confocal instrument development. LM, organized by G. Schatten (Madison), and on Integrated These goals were so close to those of the EMSA project that Acoustic/LM/EM organized by C. Rieder (Albany). In addition, the two groups decided to join forces with EMSA to provide there was an optical micro-analysis session emphasizing Raman the organization and the venue for a Confocal Workshop and techniques, organized by the Microbeam Analysis Society, for NSF to provide the financial support for the speakers expenses a total of 40 invited and 30 contributed papers on optical tech and for the publication of extended abstracts.

The Siam 100 Digit Challenge

Author: Folkmar Bornemann
Publisher: Society for Industrial & Applied
Size: 22.40 MB
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This book takes readers on a thrilling tour of some of the most important and powerful areas of contemporary numerical mathematics. The tour is organized along the 10 problems of the SIAM 100-Digit Challenge, a contest posed by Nick Trefethen of Oxford University in the January/February 2002 issue of SIAM News. The complete story of the contest as well as a lively interview with Nick Trefethen are also included. The authors, members of teams that solved all 10 problems, show in detail multiple approaches for solving each problem, ranging from elementary to sophisticated, from brute-force to schemes that can be scaled to provide thousands of digits of accuracy and that can solve even larger related problems. The authors touch on virtually every major technique of modern numerical analysis: matrix computation, iterative linear methods, limit extrapolation and convergence acceleration, numerical quadrature, contour integration, discretization of PDEs, global optimization, Monte Carlo and evolutionary algorithms, error control, interval and high-precision arithmetic, and many more. The SIAM 100-Digit Challenge: A Study in High-Accuracy Numerical Computing gives concrete examples of how to justify the validity of every single digit of a numerical answer. Methods range from carefully designed computer experiments to a posteriori error estimates and computer-assisted proofs based on interval arithmetic. This book will aid readers in developing problem-solving skills for making judicious method selections. The chapters may be read independently. Appendices A and B include basic methods of convergence acceleration and details of computing the solutions to very high accuracy. Full code for all the methods, examples, tables, and figures is given (partly in Appendix C, completely on the accompanying web page. The code is written in a variety of languages, including Mathematica, MATLAB, Maple, C, Octave, and PARI/GP. Appendix D offers a sample of additional challenging problems for those who master some of the techniques discussed here.

Medical Imaging Physics

Author: William R. Hendee
Publisher: Wiley-Liss
Size: 49.88 MB
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This comprehensive publication covers all aspects of image formation in modern medical imaging modalities, from radiography, fluoroscopy, and computed tomography, to magnetic resonance imaging and ultrasound. It addresses the techniques and instrumentation used in the rapidly changing field of medical imaging. Now in its fourth edition, this text provides the reader with the tools necessary to be comfortable with the physical principles, equipment, and procedures used in diagnostic imaging, as well as appreciate the capabilities and limitations of the technologies.

Electron Microscopy 1998

Author: International Congress on Electron Microscopy
Publisher: CRC Press
ISBN: 9780750305686
Size: 48.71 MB
Format: PDF
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The 14th International Congress on Electron Microscopy, held in Cancun, Mexico, provides a forum for all scientists working in physics, materials science and biological sciences research to discuss and share their results and ideas. This four-volume set documents recent advances in microscope technology and applications in scientific research, from HREM studies of quasicrystal and nanoscale materials to biomembrane research and art history. The 1998 meeting features a large number of contributions from Latin American countries, and a special symposium (IFSEM) on scanning electron microscopy. This is a comprehensive guide to the uses of microscopy in the pursuit of science for all researchers in physics, materials science and biological sciences.